The analysis of the modern multielement photosensors and optoelectronic methods and means on their basis
Keywords:
imaging array, pixel, charge-coupled device (ccd), position sensitive device (psd), complementary metal-oxide semiconductor (cmos)Abstract
The next revolution in the 21st century will be caused by combination of cheap optical sensors, microprocessors and lasers, which are the basis of optoelectronic measuring systems. A wide range of photodetectors including PSD, one- and two-dimensional CCD and CMOS imagers, being applied in that sort of systems, are considered in the article.Downloads
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Published
2010-11-12
How to Cite
[1]
Y. Y. Bilynskyi, “The analysis of the modern multielement photosensors and optoelectronic methods and means on their basis”, Вісник ВПІ, no. 5, pp. 9–15, Nov. 2010.
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Section
Automation and information-measuring equipment
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