The methodical deviations evaluation of two-port S-parameters measurement

Authors

  • M. A. Filyniuk
  • K. V. Ohorodnyk

Keywords:

negatronic, two-port, measurement method, s-parameters measurement, deviations evaluation, microwave frequency range

Abstract

A new method of measurement of non-standard system of two-port S-parameters is offered. Experimental verification results of the suggested method are shown. The methodical deviations evaluation results of measurement of each S-parameters are discussed. The offered method has less number of operations in comparison with classic methods and it can be used over the whole microwave frequency range.

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Published

2010-11-12

How to Cite

[1]
M. A. Filyniuk and K. V. Ohorodnyk, “The methodical deviations evaluation of two-port S-parameters measurement”, Вісник ВПІ, no. 4, pp. 93–99, Nov. 2010.

Issue

No 4 (2005)

Section

Radioelectronics and radioelectronic equipment manufacturing

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