ESTIMATION OF CURRENT FLUCTUATION SPECTRAL DENSITY IMPACT ON JOSEPHSON JUNCTION GENERATION LINE WIDTH

Authors

  • V. M. Kychak Vinnnytsia National Technical University
  • V. V. Kychak Vinnnytsia National Technical University

Keywords:

Josephson junction, linewidth, superconductivity, the spectral density of fluctuations

Abstract

Impact of low-frequency and high-frequency current fluctuation spectral density of ordinary electrons and a Cooper pair on single Josephson junction generation line width has been researched.

An opportunity to reduce the generation line width and to increase output power due to optimal allocating several Josephson junctions in a microstrip superconducting line has been considered. Influence of electrodynamic coupling circuits on the generation line width has been examined. It has been shown that a choice of Josephson junctions optimal allocation in microstrip superconducting line and electrodynamic coupling circuit parameter selection permittedto increase power almost in 4 times and to reduce the generation line width almost by an order when putting 4 and 6 Josephson junctions in the microstrip superconducting line.

Author Biographies

V. M. Kychak, Vinnnytsia National Technical University

Dr. Sc. (Eng.), Professor, Dean of the Department of the Radio Engineering, Connection and Instrument-making

V. V. Kychak, Vinnnytsia National Technical University

Senior Lecturer of the Chair of Telecommunication Systems and Television

References

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Published

2016-02-01

How to Cite

[1]
V. M. Kychak and V. V. Kychak, “ESTIMATION OF CURRENT FLUCTUATION SPECTRAL DENSITY IMPACT ON JOSEPHSON JUNCTION GENERATION LINE WIDTH”, Вісник ВПІ, no. 6, pp. 153–158, Feb. 2016.

Issue

No. 6 (2015)

Section

Radioelectronics and radioelectronic equipment manufacturing

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