Mathematical noise model of integral operational amplifiers for reliability forecast by the level of low-frequency noise

Authors

  • V. M. Kychak
  • D. V. Mykhalevskyi

Keywords:

mathematical model, operational amplifier, noise model, low-frequency noise, equivalent noise voltage

Abstract

The mathematical noise model of operational amplifiers is offered, for forecast of their reliability by the level of low-frequency noise on the stage of manufacture and input control. Research of this model showed that the level of noise voltage was higher in devices with p-n-insulation, and also it was showed considerable influence exercised by the level of input current.

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Published

2010-11-12

How to Cite

[1]
V. M. Kychak and D. V. Mykhalevskyi, “Mathematical noise model of integral operational amplifiers for reliability forecast by the level of low-frequency noise”, Вісник ВПІ, no. 3, pp. 102–108, Nov. 2010.

Issue

No 3 (2008)

Section

Radioelectronics and radioelectronic equipment manufacturing

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