Symmetrically-structured STIF detectors in system measuring devises of microwave parameters of paths

Authors

  • A. S. Mostavliuk

Keywords:

system sensor, metrological reliability, microwave detector, reflectometer, attenuation gauge

Abstract

Structural solution of system SHF detector measuring devices of microwave parameters of tracts with high metrological reliability and accuracy, which allow to decrease prevalent instrumental error reflectometer and attenuation gauge, is suggested.

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Published

2010-11-12

How to Cite

[1]
A. S. Mostavliuk, “Symmetrically-structured STIF detectors in system measuring devises of microwave parameters of paths”, Вісник ВПІ, no. 5, pp. 30–33, Nov. 2010.

Issue

No 5 (2007)

Section

Automation and information-measuring equipment

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